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ucph>Tommy: Created page with "NOEDITSECTION '''Author: Andrew Wildes, Institut Laue-Langevin''' Reflectometry probes the properties of thin films and their interfaces, even if they are buried within a..."

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Created page with "__NOEDITSECTION__ '''Author: Andrew Wildes, Institut Laue-Langevin''' Reflectometry probes the properties of thin films and their interfaces, even if they are buried within a..."

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'''Author: Andrew Wildes, Institut Laue-Langevin'''

Reflectometry probes the properties of thin films and their interfaces, even if they are buried within a sample. The technique is non-destructive and it is straight-forward to present the measurements in absolute, dimensionless units.

The technique consists of measuring the reflected intensity of a beam from a flat sample as a function of the momentum transfer given by the beam to the sample. Reflectometry probes the refractive index, which is a quantity used to describe the propagation of waves in a medium relative to the propagation of waves in a vacuum. The refractive index can change significantly from medium to medium, and thus reflectometry determines the refractive index as a function of depth in the sample. The rate at which the refractive index changes as a function of depth will also depend on the quality and smoothness of the interfaces between media, and interface effects are also probed with reflectometry. As a result, reflectometry measurements with neutrons (and X-rays) are extremely important in the study of thin films and stratified media.

{{TOC limit|3}}

= [[Thin films and interfaces]] =

{{:Thin films and interfaces}}


= [[The refractive index]] =

{{:The refractive index}}


= [[Reflection from a smooth, flat interface]] =

{{:Reflection from a smooth, flat interface}}


= [[Reflectivity of stratified media]] =

{{:Reflectivity of stratified media}}


= [[Reflectivity of periodically stratified media]] =

{{:Reflectivity of periodically stratified media}}


= [[Rough and diffuse interfaces]] =

{{:Rough and diffuse interfaces}}


 

[[Small angle neutron scattering, SANS|←]]   Previous page: [[Small angle neutron scattering, SANS]] 
[[Exercises in Reflection and refraction|→]]   Exercises: [[Exercises in Reflection and Refraction]] 
[[Diffraction from crystals|→]]   Next page: [[Diffraction from crystals]]

Neutron reflectivity - Revision history

Wikiadmin: 1 revision imported

ucph>Tommy: Created page with "__NOEDITSECTION__ '''Author: Andrew Wildes, Institut Laue-Langevin''' Reflectometry probes the properties of thin films and their interfaces, even if they are buried within a..."

ucph>Tommy: Created page with "NOEDITSECTION '''Author: Andrew Wildes, Institut Laue-Langevin''' Reflectometry probes the properties of thin films and their interfaces, even if they are buried within a..."